@INPROCEEDINGS {10407,
author={H.  Gomes and A. R. T. Testera and N.B.C. Carvalho and M. B. Barciela and K. R. Remley},
doi={},
booktitle={IEEE International Symp. on Microwave Theory and Tech.},
title={The Impact of Long-term Memory Effects  on Diode Power Probes},
year={2010},
month={May},
volume={1},
pages={596-599} 
}