@INPROCEEDINGS {24589,
author={R. Menezes and H.  Ramos and D. Pasadas and T. Rocha and A. L. Ribeiro},
doi={},
booktitle={Conf. on Telecommunications  - ConfTele},
title={Evaluation of defect depth using three different eddy current methods},
year={2015},
month={September},
volume={USB},
pages={00-00} 
}