@INPROCEEDINGS {28359,
author={A. Canelas and R. M. Martins and R. Póvoa  and N. Lourenço and N. Horta},
doi={},
booktitle={Design, Automation, and Test in Europe - DATE},
title={Efficient Yield Optimization Method using a Variable K-Means Algorithm for Analog IC Sizing},
year={2017},
month={March},
volume={N/A},
pages={1-6} 
}
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