@ARTICLE {28252,
author={D. Pasadas and H.  Ramos and B. Feng and P. Baskaran and A. L. Ribeiro},
doi={10.1109/TIM.2019.2893009},
journal={IEEE Transactions on Instrumentation and Measurement},
title={Defect Classification With SVM and Wideband Excitation in Multilayer Aluminum Plates},
year={2019},
month={February},
volume={0},
number={0},
pages={1-8},
ISSN={0018-9456}
}