@ARTICLE {8047,
author={M.E. Lopes and H.L. Gomes and M. C. R.  Medeiros and P. B.  Barquinha and L.P. Pereira and E. F. Fortunato and R. M.  Martins and I. F. Ferreira},
doi={10.1063/1.3187532},
journal={Applied Physics Letters},
title={Gate-bias stress in amorphous oxide semiconductors thin-film transistors},
year={2009},
month={August},
volume={95},
number={6},
pages={063502-063505},
ISSN={0003-6951}
}