Creating and sharing knowledge for telecommunications

Eddy Currents Testing Defect Characterization based on Non-Linear Regressions and Artificial Neural Networks

Rosado, L. S. ; Ramos, P.M. ; Janeiro, F. M. ; Piedade, M. S.

Eddy Currents Testing Defect Characterization based on Non-Linear Regressions and Artificial Neural Networks, Proc IEEE International Instrumentation and Technology Conf. - I2MTC, Graz, Austria, Vol. 1, pp. 2419 - 2424, May, 2012.

Digital Object Identifier:

Abstract
Feature extraction and defect parameters estimation
from eddy current testing data has received special attention in
the last years. Principal component analysis, wavelet
decomposition and Fourier descriptors are some of the tools used for feature extraction. Particular interest is devoted to using
artificial neural networks to perform parameters estimation and
profile reconstruction of defects. This work reports the use of non-linear regressions for feature extraction based on the modeling of the measured response by a set of additive Gaussians and artificial neural networks to estimate the width and depth of defects.