Feature Selective Validation Analysis applied to The Measurement of Electronic Circuit Electromagnetic Conducted Emissions - CISPR 25
Silveira, Tagleorge M.
; Novo, M.
; Marconi, K.
; Renno, D.
; Ferreira, E.
; Andrade, M.
; Marchiori, S.
Feature Selective Validation Analysis applied to The Measurement of Electronic Circuit Electromagnetic Conducted Emissions - CISPR 25, Proc IEEE SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC), Aveiro, Portugal, Vol. , pp. - , November, 2019.
Digital Object Identifier: 10.1109/IMOC43827.2019.9317590
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This paper proposes to investigate, with physical
measurements, the layout influence of two PCB boards from the
viewpoint of conducted emission. Two solid state H-bridges, with
identical schematics but different layouts were tested. In this paper, a correlation plan of the actual measurements focusing on the
conducted emissions (CISPR-25) is proposed. In order to evaluate
the measurements in a more objective way, the comparisons were
quantitatively evaluated using the Feature Selective Validation
(FSV) algorithm, which has a good acceptance for the comparison
between simulation and measurement results in the EMC/EMI
area. This method allows the analysis of amplitude and frequency
characteristics of an arbitrary waveform showing the correlation
and, in this experiment, determine if it is possible to minimize
the effect of the conducted emission by layout modification or if
the differences are so small that a modification is not justified.
So, the use o FSV correlation methodology in this work helps
determine if the measurements in both layouts have a reasonable