This paper presents a novel approach for accurately testing triangularwaveform generators by leveraging the Ramp Vernier Test methodology commonly used for Analog-to-Digital Converters (ADCs). The proposed procedure enables efficient measurement of the nonlinearity of a triangular waveform using a low-cost data acquisition board. The key idea is to utilize the waveform generator under test to produce the stimulus signal for the data acquisition system’s testing. By analyzing the results of this test, the nonlinearity of the acquisition system can be determined and subsequently corrected. This approach effectively eliminates the influence of the acquisition system’s nonlinearity on the estimation of the nonlinearity of the waveform generator, ensuring accurate and reliable measurements.